Skip to content
Oviatt Library

Oviatt Library Catalog

 
     
Author Kalahasti, Lakshmi Haritha, author.
Title Study on determination of parasitic resistances in SiC MESFET's / by Lakshmi Haritha Kalahasti.
Published [Northridge, California] : California State University, Northridge, 2012.
LOCATION CALL # STATUS
 Electronic Book  TA153 .Z953 2012 M64eb    ONLINE
  
Description 1 online resource (ix, 71 pages) : graphs, charts, illustrations, photographs, some color.
Content Type text
Format online resource
File Characteristics text file PDF
Thesis M.S. California State University, Northridge 2012.
Bibliography Includes bibliographical references (pages 52-57).
Summary This paper presents a simple analytical method for extracting the source, drain and gate parasitic resistances. The proposed method is based on the three simple DC measurements. The parasitic resistance values are received through numerical iterations. The parasitic resistances can also be calculated analytically. The numerical iterations are avoided so that the extraction of the parameters is simple and fast. The resistance measurements prove that the method is sensitive to the accuracy of the measured voltages. Identical Schottky diodes are assumed and the values of the parasitic resistances are extracted.
Note Description based on online resource; title from PDF title page (viewed on May 31, 2012).
Subject Electric resistance.
Local Subject Dissertations, Academic -- CSUN -- Engineering -- Electrical and Computer Engineering.
OCLC number 849911484